Brief Introduction
For each chemical element of atoms, has its specific energy level structure, the extranuclear electron with their peculiar energy in their fixed orbits, inner electron under enough energy X-ray radiation from the bondage of the atom, a free electron, we say that atoms were inspired, in the excited state, then, other outer electrons will fill the vacancy, the so-called transition, at the same time, in the form of a X-ray energy out due to the atomic energy level structure of the each element is specific, it stimulated transition after X ray energy is emitted by a specific, called the characteristic X ray The presence of the element is determined by measuring the energy of the characteristic X rays, the strength of which represents the element's content
Principle
Ray fluorescence is caused by changes of atoms in a stable atom structure consists of a nucleus and extranuclear electron the extranuclear electron with their peculiar energy in their fixed orbits, inner electron under the enough energy X-ray radiation from the bondage of the atom, releasing electronic has resulted in the electronic shell appeared phase shall be open at this time in a high-energy electron shell of the electronic layer will transition to the low energy electron shell corresponding hole to fill Because of the energy gap between the different electron shells, these energy differences are released in the form of secondary X-rays, which are released by different elements and have specific energy properties.
Reference
[1] Zhilin Yang. Principle and application of X ray fluorescence spectrometer. Science communication[A]. 1674-6708(2016) 159-0181-02
[2] Liu Ping 1, Tian He 2, Sun Jinlong 2, Slide Yongyong 2, Huang Mingbo 3. Fast analysis of tin in titanium alloy by X fluorescence spectrometry. Beijing Institute of Aeronautical Materials. 2016.06.006
Result analysis
The figure 1 shows the energy spectra of standard titanium alloy samples with w(Sn) at 9.00% and 12.94%, respectively. The figure 2 shows the work curve. On the X-ray fluorescence spectrum measured by XRF-6, there are two characteristic spectral peaks of tin, SnKα peak (25.193keV) and SnKβ peak (28.601keV), and two characteristic spectral peaks of titanium, namely TiKα peak (4.51keV) and TiKβ peak (4.93keV). If the test conditions and sample form are determined, the strength of SnKα peak and SnKβ peak is completely corresponding to the amount of W (Sn). The characteristic spectrum peaks .of SnKα (25.193keV) and SnKβ (28.601keV) are compared with the two characteristic spectrum peaks of titanium, TiKα (4.51keV) and TiKβ (4.93keV) to obtain four working curves.
The working curves can be used to quickly and accurately measure the Amount of W (Sn) in the sample by using the equation , where Ki is the calibration factor associated with the X fluorescence spectrometer; Ii is the measured intensity of characteristic fluorescence of the element to be measured; Mi is the matrix effect correction factor, which is mainly the absorption enhancement effect between elements. Si is the physical and chemical morphological correction factor of the sample.