SEM Principle

Scanning Electron Microscope (SEM) uses a focused electron beam of high-energy to scan the sample. Various physical information can be got via “the interaction between the beam and the substance”, which is then amplified and re-imaging for better characterization. SEM can be also used other analytical instruments corporately for a full analysis on the property as morphology and composition of the material.[1]

One of the most widely used SEM technique is secondary electron imaging, by which highest resolution images can be obtained. The incident electron beam controlled by the magnetic coil scans the surface of sample “point by point in a certain spatial and temporal order”, during which the secondary electrons are excited from the electron shell of atoms. The number of released secondary electrons is related with the angle between surface and the incident beam, which indicate the surface morphology.[2]

Figure 1. Schematic diagram of interior structure

Figure 2. Schematic diagram of working principle

Instrument Characterization Analysis This page is part of the collection 'Gold-Silver Alloy Solder'.

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